- scanning ion probe
- сканирующий ионный зонд
English-Russian electronics dictionary .
scanning ion probe
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Scanning ion-conductance microscopy — The scanning ion conductance microscope (SICM) consists of an electrically charged glass micro or nanopipette probe filled with electrolyte lowered toward the surface of the sample (which is non conducting for ions) in an oppositely charged bath… … Wikipedia
Scanning voltage microscopy — (SVM) sometimes also called nanopotentiometry is a scientific experimental technique based on atomic force microscopy. A conductive probe, usually only a few nanometers wide at the tip, is placed in full contact with an operational electronic or… … Wikipedia
Scanning probe microscopy — Part of a series of articles on Nanotechnology … Wikipedia
Scanning tunneling microscope — Image of reconstruction on a clean Gold(100) surface … Wikipedia
Scanning helium microscope — may refer to: * Scanning Helium Ion Microscope *Atomic nanoscope, which was proposed and discussed in the literature, but is not yet competitive with optical microscope, electron microscope, Scanning Helium Ion Microscope and various scanning… … Wikipedia
Scanning Helium Ion Microscope — Ein Helium Ionen Mikroskop (auch: Scanning Helium Ion Microscope, SHIM) ist ein bildgebendes Verfahren, welches darauf basiert, dass ein Helium Ionen Strahl das zu untersuchende Objekt abtastet[1]. Das Verfahren ähnelt dem eines… … Deutsch Wikipedia
Scanning electron microscope — These pollen grains taken on an SEM show the characteristic depth of field of SEM micrographs … Wikipedia
Near-field scanning optical microscope — Near field scanning optical microscopy (NSOM/SNOM) is a microscopic technique for nanostructure investigation that breaks the far field resolution limit by exploiting the properties of evanescent waves. This is done by placing the detector very… … Wikipedia
Feature-oriented scanning — (FOS)[1][2][3] is a method intended for high precision measurement of nanotopography as well as other surface properties and characteristics on a scanning probe microscope (SPM) using features (objects) of the surface as reference points of the… … Wikipedia
Counter-scanning — (CS)[1] is a method for measuring surface topography with a scanning probe microscope enabling correction of raster distortions resulted from drift of the microscope probe relative to the surface being measured. Two surface scans, viz. direct… … Wikipedia
Low-energy ion scattering — LEIS redirects here; for the Hawaiian garland see Lei (Hawaii). Low energy ion scattering spectroscopy (LEIS), sometimes referred to simply as ion scattering spectroscopy (ISS), is a surface sensitive analytical technique used to characterize the … Wikipedia
